Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production

Introduced: September 1968

Title

Titles differ between systems:

IPC: Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production

CPC: Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production

Full Title

Full titles differ between systems:

IPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing dielectric strength or breakdown voltage > Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production

CPC:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing dielectric strength or breakdown voltage > Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production

No child classifications to compare. This is a leaf node in both IPC and CPC.