CPC Subgroup Additional Only
G01J 2001/363 Full Title
Photometry, e.g. photographic exposure meter (spectrophotometry G01J3/00; specially adapted for radiation pyrometry G01J5/00 ) > by comparison with reference light or electric value > intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle > using separate light paths used alternately or sequentially, e.g. flicker > using electric radiation detectors
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382