CPC Subgroup Additional Only
G01N 2223/07 secondary emission
Full Title
Investigating materials by wave or particle radiation > secondary emission
13 direct subcodes
Child Classifications
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- G01N 2223/071 combination of measurements, at least 1 secondary emission
- G01N 2223/072 combination of measurements, 2 kinds of secondary emission
- G01N 2223/073 use of a laser
- G01N 2223/074 activation analysis
- G01N 2223/076 X-ray fluorescence
- G01N 2223/079 incident electron beam and measuring excited X-rays
- G01N 2223/08 incident electron beam and measuring cathode luminescence (U.V.)
- G01N 2223/081 incident ion beam, e.g. proton
- G01N 2223/084 photo-electric effect
- G01N 2223/085 photo-electron spectrum [ESCA, XPS]
- G01N 2223/086 Auger electrons
- G01N 2223/09 exo-electron emission
- G01N 2223/095 tribo-emission
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382