CPC Subgroup Additional Only
G01N 2223/33 scanning, i.e. relative motion for measurement of successive object-parts
Full Title
Investigating materials by wave or particle radiation > Accessories, mechanical or electrical features > scanning, i.e. relative motion for measurement of successive object-parts
8 direct subcodes
Child Classifications
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- G01N 2223/3301 beam is modified for scan, e.g. moving collimator
- G01N 2223/3302 object and detector fixed
- G01N 2223/3303 object fixed; source and detector move
- G01N 2223/3304 helicoidal scan
- G01N 2223/3305 detector fixed; source and body moving
- G01N 2223/3306 object rotates
- G01N 2223/3307 source and detector fixed; object moves
- G01N 2223/3308 object translates
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382