CPC Subgroup Additional Only
H01J 2237/2505 characterised by their application
Full Title
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging > Tubes for localised analysis using electron or ion beams > characterised by their application
7 direct subcodes
Child Classifications
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- H01J 2237/2511 Auger spectrometers
- H01J 2237/2516 Secondary particles mass or energy spectrometry
- H01J 2237/2538 Low energy electron microscopy [LEEM]
- H01J 2237/2555 Microprobes, i.e. particle-induced X-ray spectrometry
- H01J 2237/2583 using tunnel effects, e.g. STM, AFM
- H01J 2237/2588 Lorenz microscopy (magnetic field measurement)
- H01J 2237/2594 Measuring electric fields or potentials