DIFF Subgroup
G01B 15/08 for measuring roughness or irregularity of surfaces
Introduced: January 1995
Full Title
Full titles differ between systems:
IPC:
Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons > for measuring roughness or irregularity of surfaces
CPC:
Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons (characterised by the use of optical techniques G01B9/00, G01B11/00) > for measuring roughness or irregularity of surfaces
No child classifications to compare. This is a leaf node in both IPC and CPC.