for measuring roughness or irregularity of surfaces

Introduced: January 1995

Last revised: January 2006

Full Title

Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons > for measuring roughness or irregularity of surfaces

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS