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PCE
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DIFF Subgroup
G01N 1/32

Polishing; Etching

Introduced: September 1968

Full Title

Full titles differ between systems:

IPC:

Sampling; Preparing specimens for investigation > Preparing specimens for investigation > Polishing; Etching

CPC:

Sampling; Preparing specimens for investigation > Preparing specimens for investigation (mounting specimens on microscopic slides G02B21/34; means for supporting the objects or the materials to be analysed in electron microscopes H01J37/20 ) > Polishing; Etching

No child classifications to compare. This is a leaf node in both IPC and CPC.