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DIFF Main Group
G01N 21/00

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light (G01N3/00 - G01N19/00 take precedence)

Introduced: September 1968

Title

Titles differ between systems:

IPC: Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

CPC: Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light (G01N3/00 - G01N19/00 take precedence)

Full Title

Full titles differ between systems:

IPC:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

CPC:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light (G01N3/00 - G01N19/00 take precedence)

Additional Content IPC

Limiting references

Investigating strength properties of solid materials by application of mechanical stress Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid Analysing materials by measuring the pressure or volume of a gas or vapour Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity Investigating flow properties of materials, e.g. viscosity, plasticity; Analysing materials by determining flow properties Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials Investigating resistance of materials to the weather, to corrosion, or to light Investigating materials by mechanical methods

Application references

Investigation of spectral properties of light per se, or measurements of the properties of materials where spectral properties of light are sensed and primary emphasis is placed on creating, detecting or analysing the spectrum, providing that the properties of the materials to be investigated are of minor importance Contactless testing of electronic circuits using optical radiation

IPC and CPC are identically structured here. All 5 subcodes exist in both systems.

2 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 1980.

Child Classifications

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Top Applicants

Top Applicants (IPC)

Class G01,2013–2023, worldwide · Source: EPO PATSTAT

  1. SGCC(STATE GRID CORPORATION OF CHINA) 41,447
  2. CHINESE ACADEMY OF SCIENCES 32,952
  3. ROBERT BOSCH DE 16,470
  4. SAMSUNG ELECTRONICS COMPANY KR 10,052
  5. SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
  6. ZHEJIANG UNIVERSITY 9,529
  7. GUANGDONG POWER GRID CORPORATION 8,615
  8. TSINGHUA UNIVERSITY 7,805
  9. HALLIBURTON ENERGY SERVICES GROUP US 7,796
  10. QUALCOMM US 7,171

Top Applicants (CPC)

Class G01,2013–2023, worldwide · Source: EPO PATSTAT

  1. CHINESE ACADEMY OF SCIENCES 21,460
  2. ROBERT BOSCH DE 17,801
  3. SGCC(STATE GRID CORPORATION OF CHINA) 17,347
  4. SAMSUNG ELECTRONICS COMPANY KR 13,192
  5. QUALCOMM US 9,900
  6. HALLIBURTON ENERGY SERVICES GROUP US 9,742
  7. PHILIPS ELECTRONICS NL 7,249
  8. MITSUBISHI ELECTRIC CORPORATION JP 6,503
  9. ZHEJIANG UNIVERSITY 6,414
  10. DENSO CORPORATION JP 6,382