DIFF Subgroup
G11C 29/54 Arrangements for designing test circuits, e.g. design for test [DFT] tools
Introduced: January 2006
Full Title
Full titles differ between systems:
IPC:
Checking stores for correct operation; Testing stores during standby or offline operation > Arrangements for designing test circuits, e.g. design for test [DFT] tools
CPC:
Checking stores for correct operation ; Testing stores during standby or offline operation > Arrangements for designing test circuits, e.g. design for test [DFT] tools
No child classifications to compare. This is a leaf node in both IPC and CPC.