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DIFF Subclass Not Allocatable
H01J

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H)

Introduced: September 1968

Description

H01J covers electric discharge tubes and lamps that generate light or other radiation through electrical discharge in gases, vapors, or vacuums. This includes cathode ray tubes, fluorescent lamps, gas-filled tubes (such as neon and xenon tubes), vacuum tubes, X-ray tubes, and plasma display devices. The classification encompasses both the structural design of discharge devices and their operational principles, including electrode configurations, gas fills, and envelope materials. Closely related technologies in gas-filled devices may overlap with semiconductor light sources (H01L), which are classified separately.

Title

Titles differ between systems:

IPC: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

CPC: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H)

Full Title

Full titles differ between systems:

IPC:

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

CPC:

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H)

Additional Content IPC

Glossary

Lamp lamps In this subclass, "lamp" includes tubes emitting visible, ultra-violet or infra-red light. Spark gap spark gaps A "spark gap" is an enclosed or non-enclosed discharge device having cold electrodes and used exclusively to discharge a quantity of electrical energy in a small time duration. Spectrometer spectrometers An instrument used to disperse radiant energy or particles into a spectrum and measure properties such as wavelength, mass, energy, or index of refraction.

Limiting references

Emission spectrometry Spark gaps, including gas-filled spark gaps Electric arc lamps Particle accelerators

Application references

Isotope separation using separate tubes Investigating or analyzing surface structures in atomic ranges using scanning-probe techniques Investigating or analyzing electrically excited material, e.g. electroluminescence Analyzing materials by investigating the ionization of gases; by investigating electric discharges, e.g. emission of cathode Mass spectrometers specially adapted for column chromatography Contactless testing of electronic circuits using electron beams Electrostatic dosimeters in general Secondary-emission measurement of nuclear or X-radiation Details of scanning-probe apparatus in general Gas lasers pumped by electric discharges Generating ions to be introduced into non-enclosed gases Tubes for generating potential differences by charges carried on a gas stream Light sources using a combination of discharge and other kinds of light generation (other than those covered in group ) Generating plasma in general

Of 43 combined children, 29 exist in both systems.

14 codes are CPC-only extensions.

Note: 14 CPC extensions are marked as secondary classification only.

19 shared codes have differing titles between IPC and CPC.

Child Classifications

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Top Applicants

Top Applicants (IPC)

Class H01,2013–2023, worldwide · Source: EPO PATSTAT

  1. TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 43,574
  2. SAMSUNG ELECTRONICS COMPANY KR 42,206
  3. LG CHEM KR 21,383
  4. APPLIED MATERIALS US 20,441
  5. LG ENERGY SOLUTION KR 20,279
  6. SAMSUNG DISPLAY KR 19,725
  7. CHINESE ACADEMY OF SCIENCES 19,400
  8. TOYOTA MOTOR CORPORATION 18,819
  9. SGCC(STATE GRID CORPORATION OF CHINA) 18,082
  10. TOKYO ELECTRON JP 17,634

Top Applicants (CPC)

Class H01,2013–2023, worldwide · Source: EPO PATSTAT

  1. SAMSUNG ELECTRONICS COMPANY KR 37,897
  2. TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 36,116
  3. APPLIED MATERIALS US 21,640
  4. LG ENERGY SOLUTION KR 20,770
  5. LG CHEM KR 19,835
  6. TOKYO ELECTRON JP 18,519
  7. ROBERT BOSCH DE 14,595
  8. INTEL CORPORATION US 13,580
  9. MURATA MANUFACTURING COMPANY JP 12,151
  10. SAMSUNG SDI COMPANY KR 12,080