H02S 50/10 Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing )
Introduced: January 2014
Title
Titles differ between systems:
IPC: Testing of PV devices, e.g. of PV modules or single PV cells
CPC: Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing )
Full Title
Full titles differ between systems:
Monitoring or testing of PV systems, e.g. load balancing or fault identification > Testing of PV devices, e.g. of PV modules or single PV cells
Monitoring or testing of PV systems, e.g. load balancing or fault identification > Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing )
Additional Content IPC
Testing of semiconductor devices during manufacturing
IPC and CPC are identically structured here. All 1 subcodes exist in both systems.
IPC defines codes here since 2014.
Child Classifications
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- H02S 50/15 using optical means, e.g. using electroluminescence since 2014 IPC+CPC Available in IPC and CPC
Top Applicants
Top Applicants (IPC)
Class H02,2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 54,496
- MITSUBISHI ELECTRIC CORPORATION JP 10,495
- TOYOTA MOTOR CORPORATION 9,464
- GUANGDONG POWER GRID CORPORATION 9,339
- ROBERT BOSCH DE 8,226
- SIEMENS DE 8,218
- DENSO CORPORATION 7,063
- MITSUBISHI ELECTRIC CORPORATION 6,619
- SAMSUNG ELECTRONICS COMPANY KR 5,826
- GREE ELECTRIC APPLIANCES 5,094
Top Applicants (CPC)
Class H02,2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 24,515
- MITSUBISHI ELECTRIC CORPORATION JP 11,346
- SIEMENS DE 9,026
- ROBERT BOSCH DE 9,005
- SAMSUNG ELECTRONICS COMPANY KR 6,729
- GUANGDONG POWER GRID CORPORATION 5,740
- DENSO CORPORATION JP 5,077
- LG ELECTRONICS KR 5,041
- LG INNOTEK COMPANY KR 4,442
- TOYOTA MOTOR CORPORATION 4,349