IPC Main Group
B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
Introduced: January 2011
Classification Context
- Section:
- PERFORMING OPERATIONS; TRANSPORTING
- Class:
- NANOTECHNOLOGY
- Subclass:
- SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
Related Keywords
MEASURERING or analysis of nanostructuresmethods or apparatus for measurement or analysis of NANOSTRUCTURES
Top Applicants
Top 10 applicants by patent filingsfor class B82, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 3,032
- SAMSUNG ELECTRONICS COMPANY KR 711
- ZHEJIANG UNIVERSITY 703
- SHAANXI UNIVERSITY OF SCIENCE AND TECHNOLOGY 641
- IBM (INTERNATIONAL BUSINESS MACHINES CORPORATION) US 620
- TSINGHUA UNIVERSITY 546
- JILIN UNIVERSITY 544
- SOUTH CHINA UNIVERSITY OF TECHNOLOGY 525
- TIANJIN UNIVERSITY 524
- UNIVERSITY OF JINAN 521