IPC Subgroup
H10P 36/2 Intrinsic gettering, i.e. thermally inducing defects by using oxygen present in the silicon body
Introduced: January 2026
Full Title
Gettering within semiconductor bodies > Intrinsic gettering, i.e. thermally inducing defects by using oxygen present in the silicon body
Classification Context
- Section:
- ELECTRICITY
- Class:
- SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- Subclass:
- GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS