Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons (characterised by the use of optical techniques G01B9/00, G01B11/00)

Child Classifications

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• G01B 15/02 for measuring thickness
• G01B 15/04 for measuring contours or curvatures
• G01B 15/06 for measuring the deformation in a solid
• G01B 15/08 for measuring roughness or irregularity of surfaces