G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Description
G01B covers instruments and methods for measuring linear dimensions, including length, thickness, and diameter of objects using mechanical, optical, or electronic principles. It encompasses angle measurement devices (goniometers, protractors), area determination techniques, and surface irregularity assessment tools such as profilometers and roughness gauges. This subclass includes calibrated rulers, calipers, micrometers, dial indicators, laser measurement systems, and coordinate measuring machines used across manufacturing quality control, engineering, and metrology applications. Adjacent classes like G01C address angular measurements in surveying contexts, while G01D covers general electric/electronic measuring instruments.
12 direct subcodes
Child Classifications
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- G01B 1/00 Measuring instruments characterised by the selection of material therefor
- G01B 11/00 Measuring arrangements characterised by the use of optical techniques
- G01B 13/00 Measuring arrangements characterised by the use of fluids
- G01B 15/00 Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons (characterised by the use of optical techniques G01B9/00, G01B11/00)
- G01B 17/00 Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B 21/00 Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B 2210/00 Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B 2290/00 Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B 3/00 Measuring instruments characterised by the use of mechanical techniques
- G01B 5/00 Measuring arrangements characterised by the use of mechanical techniques
- G01B 7/00 Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B 9/00 Measuring instruments characterised by the use of optical techniques
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382