Measuring force or stress, in general (measuring force due to impact G01L5/00)

Child Classifications

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• G01L 1/005
• G01L 1/02 by hydraulic or pneumatic means
• G01L 1/04 by measuring elastic deformation of gauges, e.g. of springs
• G01L 1/06 by measuring the permanent deformation of gauges, e.g. of compressed bodies
• G01L 1/08 by the use of counterbalancing forces
• G01L 1/10 by measuring variations of frequency of stressed vibrating elements, e.g. of stressed strings (using resistance strain gauges G01L1/22)
• G01L 1/12 by measuring variations in the magnetic properties of materials resulting from the application of stress
• G01L 1/14 by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
• G01L 1/16 using properties of piezoelectric devices
• G01L 1/18 using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
• G01L 1/20 by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids (of piezo-resistive materials G01L1/18); by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
• G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis
• G01L 1/25 using wave or particle radiation, e.g. X-rays , neutrons (G01L1/24 takes precedence)
• G01L 1/26 Auxiliary measures taken, or devices used, in connection with the measurement of force, e.g. for preventing influence of transverse components of force, for preventing overload