IPC Main Group
G01L 1/00 Measuring force or stress, in general
Introduced: September 1968
Last revised: January 2006
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
Filing statistics
IPC G01L 1/00 belongs to the parent subclass G01L, which recorded 145,069 patent applications worldwide between 2013 and 2023. Annual filings grew from 8,073 in 2013 to 16,364 in 2023 (+103%), peaking at 17,249 applications in 2020. The most active applicants in class G01 are SGCC(STATE GRID CORPORATION OF CHINA) (41,447 applications), CHINESE ACADEMY OF SCIENCES (32,952 applications) and ROBERT BOSCH (16,470 applications).
Source: EPO PATSTAT, worldwide filings
Related Keywords
STRAIN gauges used for measuring stressmeasuring STRESS
13 direct subcodes
Child Classifications
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- G01L 1/02 by hydraulic or pneumatic means
- G01L 1/04 by measuring elastic deformation of gauges, e.g. of springs
- G01L 1/06 by measuring the permanent deformation of gauges, e.g. of compressed bodies
- G01L 1/08 by the use of counterbalancing forces
- G01L 1/1 by measuring variations of frequency of stressed vibrating elements, e.g. of stressed strings
- G01L 1/12 by measuring variations in the magnetic properties of materials resulting from the application of stress
- G01L 1/14 by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
- G01L 1/16 using properties of piezoelectric devices
- G01L 1/18 using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
- G01L 1/2 by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis
- G01L 1/25 using wave or particle radiation, e.g. X-rays, neutrons
- G01L 1/26 Auxiliary measures taken, or devices used, in connection with the measurement of force, e.g. for preventing influence of transverse components of force, for preventing overload
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171