DIFF Main Group
G01L 1/00 Measuring force or stress, in general (measuring force due to impact G01L5/00)
Introduced: September 1968
Title
Titles differ between systems:
IPC: Measuring force or stress, in general
CPC: Measuring force or stress, in general (measuring force due to impact G01L5/00)
Full Title
Full titles differ between systems:
IPC:
Measuring force or stress, in general
CPC:
Measuring force or stress, in general (measuring force due to impact G01L5/00)
Of 14 combined children, 13 exist in both systems.
1 codes are CPC-only extensions.
3 shared codes have differing titles between IPC and CPC.
Child Classifications
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- G01L 1/04 by measuring elastic deformation of gauges, e.g. of springs +4 CPC IPC+CPC Available in IPC and CPC
- G01L 1/06 by measuring the permanent deformation of gauges, e.g. of compressed bodies IPC+CPC Available in IPC and CPC
- G01L 1/10 by measuring variations of frequency of stressed vibrating elements, e.g. of stressed strings (using resistance strain gauges G01L1/22) +2 CPC IPC+CPC Available in IPC and CPC
- G01L 1/12 by measuring variations in the magnetic properties of materials resulting from the application of stress +3 CPC IPC+CPC Available in IPC and CPC
- G01L 1/14 by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/18 using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/20 by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids (of piezo-resistive materials G01L1/18); by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis +4 CPC IPC+CPC Available in IPC and CPC
- G01L 1/25 using wave or particle radiation, e.g. X-rays , neutrons (G01L1/24 takes precedence) since 1985 +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/26 Auxiliary measures taken, or devices used, in connection with the measurement of force, e.g. for preventing influence of transverse components of force, for preventing overload IPC+CPC Available in IPC and CPC
Top Applicants
Top Applicants (IPC)
Class G01,2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171
Top Applicants (CPC)
Class G01,2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382