DIFF Main Group
G01L 1/00 Measuring force or stress, in general (measuring force due to impact G01L5/00)
Introduced: September 1968
Title
Titles differ between systems:
IPC: Measuring force or stress, in general
CPC: Measuring force or stress, in general (measuring force due to impact G01L5/00)
Full Title
Full titles differ between systems:
IPC:
Measuring force or stress, in general
CPC:
Measuring force or stress, in general (measuring force due to impact G01L5/00)
Of 14 combined children, 13 exist in both systems.
1 codes are CPC-only extensions.
3 shared codes have differing titles between IPC and CPC.
Child Classifications
Navigate with arrow keys, Enter to open
- G01L 1/04 by measuring elastic deformation of gauges, e.g. of springs +4 CPC IPC+CPC Available in IPC and CPC
- G01L 1/06 by measuring the permanent deformation of gauges, e.g. of compressed bodies IPC+CPC Available in IPC and CPC
- G01L 1/10 by measuring variations of frequency of stressed vibrating elements, e.g. of stressed strings (using resistance strain gauges G01L1/22) +2 CPC IPC+CPC Available in IPC and CPC
- G01L 1/12 by measuring variations in the magnetic properties of materials resulting from the application of stress +3 CPC IPC+CPC Available in IPC and CPC
- G01L 1/14 by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/18 using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/20 by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids (of piezo-resistive materials G01L1/18); by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis +4 CPC IPC+CPC Available in IPC and CPC
- G01L 1/25 using wave or particle radiation, e.g. X-rays , neutrons (G01L1/24 takes precedence) since 1985 +1 CPC IPC+CPC Available in IPC and CPC
- G01L 1/26 Auxiliary measures taken, or devices used, in connection with the measurement of force, e.g. for preventing influence of transverse components of force, for preventing overload IPC+CPC Available in IPC and CPC