Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture )

Child Classifications

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• G01R 31/001
• G01R 31/003
• G01R 31/005
• G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12)
• G01R 31/08 Locating faults in cables, transmission lines, or networks
• G01R 31/12 Testing dielectric strength or breakdown voltage
• G01R 31/24 Testing of discharge tubes (during manufacture H01J9/42)
• G01R 31/26 Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )
• G01R 31/28 Testing of electronic circuits, e.g. by signal tracer ( testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers G06F11/00; checking static stores for correct operation G11C29/00 )
• G01R 31/327 Testing of circuit interrupters, switches or circuit-breakers
• G01R 31/34 Testing dynamo-electric machines
• G01R 31/36 Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
• G01R 31/40 Testing power supplies (testing photovoltaic devices H02S50/10)
• G01R 31/44 Testing lamps
• G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs H01T13/58)