G01R 31/26 Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )
Full Title
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )
Filing statistics
CPC G01R 31/26 belongs to the parent subclass G01R, which recorded 383,760 patent applications worldwide between 2013 and 2023. Annual filings grew from 19,870 in 2013 to 47,277 in 2023 (+138%). The most active applicants in class G01 are CHINESE ACADEMY OF SCIENCES (21,460 applications), ROBERT BOSCH (17,801 applications) and SGCC(STATE GRID CORPORATION OF CHINA) (17,347 applications).
Source: EPO PATSTAT, worldwide filings
8 direct subcodes
Child Classifications
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- G01R 31/265 Contactless testing
- G01R 31/27 Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382