CPC Subgroup
G01R 31/26 Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )
Full Title
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment )
8 direct subcodes
Child Classifications
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- G01R 31/265 Contactless testing
- G01R 31/27 Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements