Functional testing (G01R31/3177 takes precedence)

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ( testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture ) > Testing of electronic circuits, e.g. by signal tracer ( testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers G06F11/00; checking static stores for correct operation G11C29/00 ) > Testing of digital circuits > Functional testing (G01R31/3177 takes precedence)

Child Classifications

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• G01R 31/31813
• G01R 31/31816
• G01R 31/3183 Generation of test inputs, e.g. test vectors, patterns or sequences
• G01R 31/3185 Reconfiguring for testing, e.g. LSSD, partitioning
• G01R 31/3187 Built-in tests
• G01R 31/319 Tester hardware, i.e. output processing circuits