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IPC Subgroup
G01R 31/3181

Functional testing

Introduced: January 1995

Last revised: January 2006

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer > Testing of digital circuits > Functional testing

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

4 direct subcodes

Child Classifications

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  • G01R 31/3183 Generation of test inputs, e.g. test vectors, patterns or sequences
  • G01R 31/3185 Reconfiguring for testing, e.g. LSSD, partitioning
  • G01R 31/3187 Built-in tests