Checking stores for correct operation ; Testing stores during standby or offline operation

Child Classifications

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• G11C 29/003
• G11C 29/006
• G11C 29/02 Detection or location of defective auxiliary circuits, e.g. defective refresh counters
• G11C 29/04 Detection or location of defective memory elements
• G11C 29/52 Protection of memory contents; Detection of errors in memory contents
• G11C 29/54 Arrangements for designing test circuits, e.g. design for test [DFT] tools
• G11C 29/56 External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
• G11C 29/70