IPC Main Group
G11C 29/00 Checking stores for correct operation; Testing stores during standby or offline operation
Introduced: September 1968
Last revised: January 2006
Classification Context
- Section:
- PHYSICS
- Class:
- INFORMATION STORAGE
- Subclass:
- STATIC STORES
Filing statistics
IPC G11C 29/00 belongs to the parent subclass G11C, which recorded 132,701 patent applications worldwide between 2013 and 2023. Annual filings grew from 10,722 in 2013 to 11,789 in 2023 (+10%), peaking at 14,304 applications in 2021. The most active applicants in class G11 are MICRON TECHNOLOGY (10,574 applications), SK HYNIX (9,138 applications) and SAMSUNG ELECTRONICS COMPANY (9,004 applications).
Source: EPO PATSTAT, worldwide filings
5 direct subcodes
Child Classifications
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- G11C 29/02 Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C 29/04 Detection or location of defective memory elements
- G11C 29/52 Protection of memory contents; Detection of errors in memory contents
- G11C 29/54 Arrangements for designing test circuits, e.g. design for test [DFT] tools
- G11C 29/56 External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Top Applicants
Top 10 applicants by patent filingsfor class G11, 2013–2023, worldwide · Source: EPO PATSTAT
- MICRON TECHNOLOGY US 10,574
- SK HYNIX KR 9,138
- SAMSUNG ELECTRONICS COMPANY KR 9,004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 3,739
- IBM (INTERNATIONAL BUSINESS MACHINES CORPORATION) US 3,443
- INTEL CORPORATION US 2,952
- SANDISK TECHNOLOGIES US 2,905
- WESTERN DIGITAL TECHNOLOGIES US 2,630
- TOSHIBA CORPORATION JP 2,593
- SEAGATE TECHNOLOGY US 2,472