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Particle spectrometers or separator tubes > Details

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• H01J 49/022
• H01J 49/025
• H01J 49/04 Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
• H01J 49/06 Electron- or ion-optical arrangements
• H01J 49/08 Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons
• H01J 49/10 Ion sources; Ion guns
• H01J 49/20 Magnetic deflection
• H01J 49/22 Electrostatic deflection
• H01J 49/24 Vacuum systems, e.g. maintaining desired pressures