Details

Child Classifications

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• H01J 49/022 CPC only CPC only
• H01J 49/025 +1 CPC CPC only CPC only
• H01J 49/04 Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components since 1980 +7 CPC IPC+CPC Available in IPC and CPC
• H01J 49/06 Electron- or ion-optical arrangements since 1980 +4 CPC IPC+CPC Available in IPC and CPC
• H01J 49/08 Electron sources, e.g. for generating photo-electrons, secondary electrons or Auger electrons since 1980 IPC+CPC Available in IPC and CPC
• H01J 49/10 Ion sources; Ion guns since 1980 +3 CPC IPC+CPC Available in IPC and CPC
• H01J 49/20 Magnetic deflection since 1980 IPC+CPC Available in IPC and CPC
• H01J 49/22 Electrostatic deflection since 1980 IPC+CPC Available in IPC and CPC
• H01J 49/24 Vacuum systems, e.g. maintaining desired pressures since 1980 IPC+CPC Available in IPC and CPC