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PCE
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DIFF Subgroup
G01N 21/894

Pinholes

Introduced: January 2000

Full Title

Full titles differ between systems:

IPC:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light > Systems specially adapted for particular applications > Investigating the presence of flaws, defects or contamination > in moving material, e.g. paper, textiles > characterised by the flaw, defect or object feature examined > Pinholes

CPC:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light (G01N3/00 - G01N19/00 take precedence) > Systems specially adapted for particular applications > Investigating the presence of flaws or contamination > in moving material, e.g. running paper or textiles (G01N21/90, G01N21/91, G01N21/94 take precedence) > characterised by the flaw, defect or object feature examined > Pinholes

No child classifications to compare. This is a leaf node in both IPC and CPC.