Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials > Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials > Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions