by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Introduced: September 1968

Full Title

Full titles differ between systems:

IPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

CPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Of 11 combined children, 9 exist in both systems.

2 codes are CPC-only extensions.

4 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 1974.

Child Classifications

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G01N 23/20008 Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor (monochromators for X- rays using crystals G21K1/06) since 2018 IPC+CPC Available in IPC and CPC
G01N 23/20058 Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method since 2018 IPC+CPC Available in IPC and CPC
G01N 23/20066 Measuring inelastic scatter of gamma rays, e.g. Compton effect since 2018 IPC+CPC Available in IPC and CPC
G01N 23/20075 CPC only CPC only
G01N 23/20083 CPC only CPC only
G01N 23/20091 Measuring the energy-dispersion spectrum [EDS] of diffracted radiation since 2018 IPC+CPC Available in IPC and CPC
G01N 23/201 by measuring small-angle scattering since 1974 IPC+CPC Available in IPC and CPC
G01N 23/203 Measuring back scattering since 1974 IPC+CPC Available in IPC and CPC
G01N 23/205 using diffraction cameras since 1974 IPC+CPC Available in IPC and CPC
G01N 23/2055 Analysing diffraction patterns since 2018 IPC+CPC Available in IPC and CPC
G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions since 1974 +2 CPC IPC+CPC Available in IPC and CPC

Top Applicants

Top Applicants (IPC)

Class G01,2013–2023, worldwide · Source: EPO PATSTAT

SGCC(STATE GRID CORPORATION OF CHINA) 41,447
CHINESE ACADEMY OF SCIENCES 32,952
ROBERT BOSCH DE 16,470
SAMSUNG ELECTRONICS COMPANY KR 10,052
SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
ZHEJIANG UNIVERSITY 9,529
GUANGDONG POWER GRID CORPORATION 8,615
TSINGHUA UNIVERSITY 7,805
HALLIBURTON ENERGY SERVICES GROUP US 7,796
QUALCOMM US 7,171

Top Applicants (CPC)

Class G01,2013–2023, worldwide · Source: EPO PATSTAT

CHINESE ACADEMY OF SCIENCES 21,460
ROBERT BOSCH DE 17,801
SGCC(STATE GRID CORPORATION OF CHINA) 17,347
SAMSUNG ELECTRONICS COMPANY KR 13,192
QUALCOMM US 9,900
HALLIBURTON ENERGY SERVICES GROUP US 9,742
PHILIPS ELECTRONICS NL 7,249
MITSUBISHI ELECTRIC CORPORATION JP 6,503
ZHEJIANG UNIVERSITY 6,414
DENSO CORPORATION JP 6,382