DIFF Subgroup
G01Q 60/14 STP [Scanning Tunnelling Potentiometry]
Introduced: January 2010
Full Title
Full titles differ between systems:
IPC:
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes > STP [Scanning Tunnelling Potentiometry]
CPC:
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof > STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes > STP [Scanning Tunnelling Potentiometry]
No child classifications to compare. This is a leaf node in both IPC and CPC.