Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof

Introduced: January 2010

Title

Titles differ between systems:

IPC: Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof

CPC: Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof

Full titles differ between systems:

IPC:

Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof

CPC:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof

IPC and CPC are identically structured here. All 9 subcodes exist in both systems.

1 shared codes have differing titles between IPC and CPC.

IPC defines codes here since 2010.

Navigate with arrow keys, Enter to open

G01Q 60/02 Multiple-type SPM, i.e. involving more than one SPM techniques since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/10 STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/18 SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/24 AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/44 SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/46 SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/50 MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/58 SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes since 2010 IPC+CPC Available in IPC and CPC
G01Q 60/60 SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes since 2010 IPC+CPC Available in IPC and CPC