DIFF Subgroup
H04N 25/69 SSIS comprising testing or correcting structures for circuits other than pixel cells
Introduced: January 2023
Full Title
Circuitry of solid-state image sensors [SSIS]; Control thereof > Noise processing, e.g. detecting, correcting, reducing or removing noise > applied to defects > SSIS comprising testing or correcting structures for circuits other than pixel cells
No child classifications to compare. This is a leaf node in both IPC and CPC.