DIFF Main Group
H10P 36/00 Gettering within semiconductor bodies
Introduced: January 2026
Of 2 combined children, 1 exist in both systems.
1 codes are CPC-only extensions.
IPC defines codes here since 2026.
Child Classifications
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- H10P 36/20 Intrinsic gettering, i.e. thermally inducing defects by using oxygen present in the silicon body since 2026 IPC+CPC Available in IPC and CPC