H10P 74/27 — IPC vs CPC Diff | Patent Classification Explorer

DIFF Subgroup

H10P 74/27

Full Title

Testing or measuring during manufacture or treatment of wafers, substrates or devices

Of 2 combined children, 0 exist in both systems.

2 codes are CPC-only extensions.

This code exists only in CPC.

Diff view requires codes present in both systems.