DIFF Main Group
H10P 74/00 Testing or measuring during manufacture or treatment of wafers, substrates or devices
Introduced: January 2026
CPC subdivides this area 3x more granularly than IPC with 2 additional codes.
2 codes are CPC-only extensions.
IPC defines codes here since 2026.
Child Classifications
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- H10P 74/20 characterised by the properties tested or measured, e.g. structural or electrical properties since 2026 +2 CPC IPC+CPC Available in IPC and CPC