applied to defects

Full Title

Circuitry of solid-state image sensors [SSIS]; Control thereof > Noise processing, e.g. detecting, correcting, reducing or removing noise > applied to defects

Classification Context

Section:

ELECTRICITY

Class:

ELECTRIC COMMUNICATION TECHNIQUE

Subclass:

PICTORIAL COMMUNICATION, e.g. TELEVISION

Child Classifications

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• H04N 25/683 by defect estimation performed on the scene signal, e.g. real time or on the fly detection
• H04N 25/69 SSIS comprising testing or correcting structures for circuits other than pixel cells