CPC Main Group
G01B 7/00 Measuring arrangements characterised by the use of electric or magnetic techniques
13 direct subcodes
Child Classifications
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- G01B 7/004 for measuring coordinates of points
- G01B 7/02 for measuring length, width or thickness (G01B7/004, G01B7/12 take precedence)
- G01B 7/12 for measuring diameters
- G01B 7/14 for measuring distance or clearance between spaced objects or spaced apertures (G01B7/30 takes precedence)
- G01B 7/16 for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B 7/26 for measuring depth
- G01B 7/28 for measuring contours or curvatures
- G01B 7/30 for measuring angles or tapers; for testing the alignment of axes
- G01B 7/32 for measuring areas
- G01B 7/34 for measuring roughness or irregularity of surfaces
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382