IPC Main Group
G01B 7/00 Measuring arrangements characterised by the use of electric or magnetic techniques
Introduced: September 1968
Last revised: January 2006
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
10 direct subcodes
Child Classifications
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- G01B 7/004 for measuring coordinates of points
- G01B 7/02 for measuring length, width, or thickness
- G01B 7/12 for measuring diameters
- G01B 7/14 for measuring distance or clearance between spaced objects or spaced apertures
- G01B 7/16 for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B 7/26 for measuring depth
- G01B 7/28 for measuring contours or curvatures
- G01B 7/3 for measuring angles or tapers; for testing the alignment of axes
- G01B 7/32 for measuring areas
- G01B 7/34 for measuring roughness or irregularity of surfaces
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171