by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Full Title

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Child Classifications

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• G01N 23/20008 Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor (monochromators for X- rays using crystals G21K1/06)
• G01N 23/20058 Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
• G01N 23/20066 Measuring inelastic scatter of gamma rays, e.g. Compton effect
• G01N 23/20075
• G01N 23/20083
• G01N 23/20091 Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
• G01N 23/201 by measuring small-angle scattering
• G01N 23/203 Measuring back scattering
• G01N 23/205 using diffraction cameras
• G01N 23/2055 Analysing diffraction patterns
• G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions