G01N 23/22 by measuring secondary emission from the material
Full Title
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material
Filing statistics
CPC G01N 23/22 belongs to the parent subclass G01N, which recorded 1,076,242 patent applications worldwide between 2013 and 2023. Annual filings grew from 58,557 in 2013 to 108,067 in 2023 (+85%), peaking at 123,338 applications in 2020. The most active applicants in class G01 are CHINESE ACADEMY OF SCIENCES (21,460 applications), ROBERT BOSCH (17,801 applications) and SGCC(STATE GRID CORPORATION OF CHINA) (17,347 applications).
Source: EPO PATSTAT, worldwide filings
8 direct subcodes
Child Classifications
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- G01N 23/2202 Preparing specimens therefor
- G01N 23/2204 Specimen supports therefor; Sample conveying means therefore
- G01N 23/2206 Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
- G01N 23/2209 using wavelength dispersive spectroscopy [WDS]
- G01N 23/221 by activation analysis
- G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
- G01N 23/225 using electron or ion
- G01N 23/227 Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382