CPC Subgroup
G01N 23/2276 using the Auger effect, e.g. Auger electron spectroscopy [AES]
Full Title
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM] > using the Auger effect, e.g. Auger electron spectroscopy [AES]