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PCE
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CPC Subgroup
G01N 23/227

Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Full Title

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

2 direct subcodes

Child Classifications

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  • G01N 23/2273 Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
  • G01N 23/2276 using the Auger effect, e.g. Auger electron spectroscopy [AES]