DIFF Subgroup
G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Introduced: July 1974
Full Title
Full titles differ between systems:
IPC:
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
CPC:
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
No child classifications to compare. This is a leaf node in both IPC and CPC.