DIFF Subgroup
G01N 23/22 by measuring secondary emission from the material
Introduced: September 1968
Full Title
Full titles differ between systems:
IPC:
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material
CPC:
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material
IPC and CPC are identically structured here. All 8 subcodes exist in both systems.
3 shared codes have differing titles between IPC and CPC.
IPC defines codes here since 1974.
Child Classifications
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- G01N 23/2204 Specimen supports therefor; Sample conveying means therefore since 2018 IPC+CPC Available in IPC and CPC
- G01N 23/2206 Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement since 2018 IPC+CPC Available in IPC and CPC
- G01N 23/2209 using wavelength dispersive spectroscopy [WDS] since 2018 IPC+CPC Available in IPC and CPC
- G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence since 1974 IPC+CPC Available in IPC and CPC
- G01N 23/227 Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM] since 1974 IPC+CPC Available in IPC and CPC