G01N 23/225 using electron or ion
Introduced: July 1974
Title
Titles differ between systems:
IPC: using electron or ion microprobes
CPC: using electron or ion
Full Title
Full titles differ between systems:
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > using electron or ion microprobes
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > using electron or ion
IPC and CPC are identically structured here. All 2 subcodes exist in both systems.
IPC defines codes here since 2018.
Child Classifications
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- G01N 23/2251 using incident electron beams, e.g. scanning electron microscopy [SEM] since 2018 IPC+CPC Available in IPC and CPC
- G01N 23/2255 using incident ion beams, e.g. proton beams since 2018 IPC+CPC Available in IPC and CPC