G01N 23/225 using electron or ion
Introduced: July 1974
Title
Titles differ between systems:
IPC: using electron or ion microprobes
CPC: using electron or ion
Full Title
Full titles differ between systems:
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > using electron or ion microprobes
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > using electron or ion
IPC and CPC are identically structured here. All 2 subcodes exist in both systems.
IPC defines codes here since 2018.
Child Classifications
Navigate with arrow keys, Enter to open
- G01N 23/2251 using incident electron beams, e.g. scanning electron microscopy [SEM] since 2018 IPC+CPC Available in IPC and CPC
- G01N 23/2255 using incident ion beams, e.g. proton beams since 2018 IPC+CPC Available in IPC and CPC
Top Applicants
Top Applicants (IPC)
Class G01,2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171
Top Applicants (CPC)
Class G01,2013–2023, worldwide · Source: EPO PATSTAT
- CHINESE ACADEMY OF SCIENCES 21,460
- ROBERT BOSCH DE 17,801
- SGCC(STATE GRID CORPORATION OF CHINA) 17,347
- SAMSUNG ELECTRONICS COMPANY KR 13,192
- QUALCOMM US 9,900
- HALLIBURTON ENERGY SERVICES GROUP US 9,742
- PHILIPS ELECTRONICS NL 7,249
- MITSUBISHI ELECTRIC CORPORATION JP 6,503
- ZHEJIANG UNIVERSITY 6,414
- DENSO CORPORATION JP 6,382