DIFF Main Group
G01Q 30/00 Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
Introduced: January 2010
IPC and CPC are identically structured here. All 5 subcodes exist in both systems.
IPC defines codes here since 2010.
Child Classifications
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- G01Q 30/02 Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope since 2010 +1 CPC IPC+CPC Available in IPC and CPC
- G01Q 30/08 Means for establishing or regulating a desired environmental condition within a sample chamber since 2010 IPC+CPC Available in IPC and CPC
- G01Q 30/18 Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields since 2010 IPC+CPC Available in IPC and CPC