IPC Main Group
G01Q 30/00 Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
Introduced: January 2010
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
5 direct subcodes
Child Classifications
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- G01Q 30/02 Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
- G01Q 30/04 Display or data processing devices
- G01Q 30/08 Means for establishing or regulating a desired environmental condition within a sample chamber
- G01Q 30/18 Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields
- G01Q 30/2 Sample handling devices or methods