DIFF Subgroup
G01Q 60/06 SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
Introduced: January 2010
Full Title
Full titles differ between systems:
IPC:
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > Multiple-type SPM, i.e. involving two or more SPM techniques > SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
CPC:
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof > Multiple-type SPM, i.e. involving more than one SPM techniques > SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
No child classifications to compare. This is a leaf node in both IPC and CPC.