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PCE
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DIFF Subgroup
G01Q 60/08

MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy

Introduced: January 2010

Title

Titles differ between systems:

IPC: MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy]

CPC: MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy

Full Title

Full titles differ between systems:

IPC:

Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > Multiple-type SPM, i.e. involving two or more SPM techniques > MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy]

CPC:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof > Multiple-type SPM, i.e. involving more than one SPM techniques > MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy

No child classifications to compare. This is a leaf node in both IPC and CPC.